X-ray diffraction (XRD) is a powerful nondestructive technique for characterizing crystalline materials. It provides information on crystal structure, phase, preferred crystal orientation (texture) and other structural parameters, such as average grain size, crystallinity, strain and crystal defects. In addition, X-ray diffraction peaks are produced by constructive interference of a monochromatic beam of X-rays diffracted at specific angles from each set of lattice planes in a sample. The peak intensities are determined by the distribution of atoms within the lattice. Consequently, the X-ray diffraction pattern is the fingerprint of the periodic atomic arrangements in a given material. A search of the ICDD (International Centre for Diffraction Data) database of X-ray diffraction patterns enables the phase identification of a large variety of crystalline samples.
EAG’s multiple X-ray diffraction systems are equipped with optical modules that can be exchanged, depending on the analysis requirement, without affecting the accuracy of positioning. It is simple to change between line and point focus of the X-ray source, enabling simple switching from a regular XRD configuration to a high-resolution XRD configuration as needed.
Different combinations of optical modules enable the analysis of powders, coatings, thin films, slurries, fabricated parts or epitaxial films. EAG also has microdiffractometers with 2D area detectors for small spot (<50 µm) XRD, providing good signal-to-noise even with small X-ray beam sizes.
Main Applications of XRD Analysis
Firstly, identification/quantification of crystalline phase
Measurement of average crystallite size, strain or micro-strain effects in bulk materials and thin-film
Quantification of preferred orientation (texture) in thin films, multi-layer stacks and manufactured parts
Determination of the ratio of crystalline to amorphous material in bulk materials and thin-films
Phase identification for a large variety of bulk and thin-film samples
Detecting minor crystalline phases (at concentrations greater than ~1%)
Determining crystallite size for polycrystalline films and materials
Determining percentage of material in crystalline form versus amorphous
Measuring sub-milligram loose powder or dried solution samples for phase identification
Analyzing films as thin as 50 Å for texture and phase behaviors
Determining strain and composition in epitaxial thin films
Determining surface offcut in single crystal materials
Lastly, measuring residual stress in bulk metals and ceramics
XRD Strengths
Firstly, nondestructive
Secondly, quantitative measurement of phase and texture orientation
Thirdly, minimal or no sample preparation requirements
Lastly, ambient conditions for all analysis
XRD Limitations
Cannot identify amorphous materials
No depth profile information
Minimum spot size of ~25 µm
X-Ray Diffraction Technical Specifications
Signal Detected: Diffracted X-rays
Elements Detected: All elements, assuming they are present in a crystalline matrix
In conclusion, EAG offers our customers XRD services to analyze many materials. Moreover, you can count on fast turnaround times, accurate data, and person-to-person service, ensuring you understand the information that you receive.
Would you like to learn more about using X-Ray Diffraction (XRD)?
Contact us today for your X-Ray Diffraction (XRD) needs. Please complete the form below to have an EAG expert contact you.
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