TOF-SIMS (Time of Flight Secondary Ion Mass Spectrometry) is a surface analysis technique which is used to investigate the extreme surfaces of samples, where it can provide information about elemental, inorganic and organic species that are present. This information can be used to compare surface treatments, identify contaminants, and determine the root cause of surface related problems. When combined with cluster ion sputtering, the resulting depth profiles can show variations in chemical composition with respect to depth.
This webinar will expand and sharpen your technical knowledge about TOF-SIMS as you learn more about this highly flexible technique.We will also discuss complementary techniques and the relationship between TOF-SIMS and other surface mass spectrometry techniques.
In this webinar we will cover:
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