Of the gamut of analytical techniques provided by EAG – a few are prized for their extremely surface sensitive analytical capabilities. XPS, Auger and TOF-SIMS are often used to understand chemistry in the top few nanometers of a sample surface. Surface chemistry affects multiple properties including adhesion, wettability, appearance, cleanliness, etc.
These techniques have found broad utility exemplified by the case studies we will present. The strengths of each technique in regard to analytical problem solving will be discussed.
In this webinar we will cover:
Importance of surface analysis
TOF-SIMS case studies
Mold Release Contamination on Polystyrene
Additive Manufacturing Metal Powder Ion Imaging
Pharmaceutical Drug Bead Cross-Section Analysis
Depth Profiling of Thin Organic Films on Cell Phone Screen Protectors
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