Ask the Expert Series - All About SIMS Webinar

In the full webinar we answer pre-submitted questions from our audience about Secondary Ion Mass Spectrometry.

Secondary Ion Mass Spectrometry (SIMS) detects very low concentrations of dopants and impurities. The technique provides elemental depth profiles over a wide depth range from a few angstroms (Å) to tens of micrometers (µm). The sample surface is sputtered/etched with a beam of primary ions, (usually O₂⁺ or Cs⁺) while secondary ions formed during the sputtering process are extracted and analyzed using a mass spectrometer (quadrupole, magnetic sector or Time of flight). The secondary ions can range in concentration from matrix levels down to sub-ppm trace levels. 

EAG is the industry standard for SIMS analysis, offering the best detection limits, along with accurate concentration and layer structure identification. EAG’s depth and scope of experience and commitment to research and development in the SIMS field is unrivaled. EAG has the largest range of Secondary Ion Mass Spectrometry instruments worldwide (more than 40), staffed by exceptionally qualified scientists. EAG also has the world’s largest reference material library of ion-implanted and bulk-doped standards for accurate SIMS quantification.

Do you have burning questions about SIMS that you need answered? Are you confused with the different types of SIMS and how they can be used for your project? Are you new to this industry and just want to learn more? Do you simply want to develop a deeper understanding of SIMS? If so, please join us for an intimate Q&A with Eurofins EAG Laboratories’ Chief Scientist Emeritus Charles W. Magee, Ph.D. During this 30 minute session Dr. Magee will answer pre-submitted questions from our audience. If time runs out and all questions have not been answered a follow up email will be sent out to all attendees with those answers.