Webinars

Welcome to our webinar page where we have created a series of webinars that we hope you will find engaging, and helpful. Please check back as we are continuing to add more content, and follow us on social media.

TECHNIQUES & SERVICES WEBINARS

AES

AES Webinar

This webinar is an introduction to Auger Electron Spectroscopy. It will include the principles of the technique with examples.

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AFM

AFM & OP Webinar

This webinar will introduce you to AFM and OP, with a overview of the theory of each technique and representative examples of them in action.

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APT

APT Webinar

In this webinar we introduce Atom Probe Tomography (APT) which is a technique that provides three-dimensional (3D) chemical and spatial maps.

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EBSD

EBSD Webinar

This webinar will focus on Electron Backscatter Diffraction (EBSD) and Electron channeling contrast imaging (ECCI)

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ESD

ESD Webinar

In this webinar we introduce electrostatic discharge (ESD) testing which is one of the failure mechanisms for integrated circuit parts

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FIB

FIB Webinar

In this webinar we introduce Advanced Focused Ion Beam (FIB) which provides precise cross-section imaging analysis

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GC-MS

GC-MS Webinar

In this webinar we will focus on Gas Chromatography-Mass Spectrometry (GC-MS) which allows for the identification of specific molecules

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IGA

IGA Webinar

This webinar will focus on Instrumental Gas Analysis (IGA) that measures gas-forming elements present in solid materials.

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LA-ICP-MS

LA-ICP-MS Webinar

This webinar is an introduction to Laser Ablation-Inductively Coupled Plasma-Mass Spectrometry for direct elemental and isotopic analysis.

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PED

PED Webinar

In this webinar we introduce Precession Electron Diffraction (PED) which has been essential to nano-scale structural analysis

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RBS

RBS Webinar

In this webinar we will focus on Rutherford Backscattering Spectrometry (RBS) which is a thin film analysis technique

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SEM-CL

SEM-CL Webinar

In this webinar we will focus on SEM Cathodoluminescence (SEM-CL) Analyses for Materials such as compound semiconductors

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SIMS

SIMS Webinar

In this webinar we will focus on Dynamic Secondary Ion Mass Spectrometry which used to investigate the elemental structure of materials.

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TEM

TEM Webinar

In this webinar we will introduce the principles of Transmission Electron Microscopy (TEM) with a focus on real-world problem-solving.

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TOF-SIMS

TOF-SIMS Webinar

In this webinar we introduce TOF-SIMS which is a surface analysis technique used to investigate the extreme surfaces of samples.

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XRF & TXRF

TXRF Webinar

In this webinar we introduce Total Reflection X-ray Fluorescence (TXRF) which is a non-destructive elemental survey technique.

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XRD

XRD Webinar

In this webinar we introduce X-ray Diffraction (XRD) which is a analytical technique for the examination of crystalline materials.

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XRF & TXRF

XRF Webinar

In this webinar we introduce X-ray Fluorescence Spectroscopy (XRF) which is a analytical technique used for elemental analysis of materials.

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ADDITIVE MANUFACTURING/3D PRINTING WEBINARS

BATTERY ANALYSIS WEBINARS

MATERIALS ANALYSIS WEBINARS

Ask the Expert - ICP

Ask the Expert: Elemental Analysis with ICP

June 27, 2024
During this live Ask the Expert event, we will answer pre-submitted questions from our audience regarding Elemental Analysis with Inductively Coupled Plasma (ICP-OES, ICP-MS, LA-ICP-MS). These techniques provide full survey major, minor, trace element analysis, and purity certification for up to 69 measurable elements.

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Ask the Expert: Auger, TOF-SIMS, XPS

Ask the Experts: Auger, TOF-SIMS, XPS

Surface chemistry affects multiple properties including adhesion, wettability, appearance and cleanliness. Auger, TOF-SIMS and XPS are often used to understand chemistry in the top few nanometers of a sample surface.

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MEDICAL & PHARMACEUTICAL WEBINARS

MICROELECTRONICS TEST & ENGINEERING WEBINARS

Ask the Expert: ATE Testing

ATE testing automates and streamlines the testing process of microelectronic devices by using specialized hardware and software to perform a wide range of functional tests under various conditions. Come learn more about ATE and what EAG can do for you.

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Ask the Expert: ESD

Damage caused by ESD is one of the primary failure mechanisms for integrated circuits. Testing susceptibility to ESD events is crucial in the success of electronic devices and is essential for the qualification process.

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Dye & Pry

Dye & Pry Webinar

In this webinar we introduce Dye and Pry that involves cleaning a sample to remove debris & flux around solder, then exposing it to a red dye.

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ESD

ESD Webinar

In this webinar we introduce electrostatic discharge (ESD) testing which is one of the failure mechanisms for integrated circuit parts

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