XPS

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Ask the Expert: Auger, TOF-SIMS, XPS

Ask the Experts: Auger, TOF-SIMS, XPS

Surface chemistry affects multiple properties including adhesion, wettability, appearance and cleanliness. Auger, TOF-SIMS and XPS are often used to understand chemistry in the top few nanometers of a sample surface.

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This plot shows GDMS data acquired from eight LiFePO4 cathode samples from a range of suppliers.

Battery Technology

Battery materials characterization services includes analysis of raw materials, surface chemistry, composition, morphology and uniformity

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glucose needles

Evaluating the Cleanliness of Medical Devices

Eurofins EAG has a wide array of analytical techniques to verify the cleanliness of medical devices. We’ve helped our customers evaluate the cleanliness of their products using techniques including NVR analysis, often in combination with FTIR, XPS and TOF-SIMS.

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LED Analysis Brochure header

LED Analysis

LED characterization, from process control to failure analysis to construction analysis, EAG Laboratories supports your LED analysis needs.

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SMST 2024

SMST 2024

May 6-10, 2024
Eurofins EAG Laboratories will be presenting “Thermal Oxide Characterization – Heat Treat Modality vs. Composition“ on May 10th. We hope to see you there!

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3D printed metal

Surface Analysis on 3D Printed Titanium

For 3D printed products, XPS can provide composition and bonding information for the top 5-10nm sample surfaces. Oftentimes, surface contamination/oxide thickness would affect the appearance (as well as performance when applicable) of the material, and XPS could help identify the source and/or cause.

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contamination control on compound semiconductor

Surface Contamination on Compound Semiconductors

Contamination control and defect reduction are critical issues in the manufacturing process of compound semiconductor devices which can impact the performance of the end product. We can provide valuable insights to identify contaminants and characterize materials throughout the product lifecycle.

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