Accurate Composition and Quantification of Materials – RBS
RBS is the one technique where we can really say that the composition and concentration are accurately determined for thin films.
Ask the Expert: Composition and Contaminant Measurements of Solid State Materials
During this live Ask the Expert event, we will answer pre-submitted questions from our audience regarding materials analysis with various X-ray and ion beam analytical techniques.
Coatings on glass
Investigation of the layer structure, identity and composition of an unknown coating system can be done in several ways.
Determining Density of Thin Films
Thin films are widely used in many high-tech devices & consumer products. We discuss the processes used to measure the density of such films.
RBS Webinar
In this webinar we will focus on Rutherford Backscattering Spectrometry (RBS) which is a thin film analysis technique
Rutherford Backscattering Spectrometry (RBS) Services
View typical RBS services results from EAG used for compositional thin film analysis for semiconductors, optimal coatings and more.
Rutherford Backscattering Spectrometry (RBS) Tutorial
RBS Tutorial from EAG includes discussion of tandem accelerators, voltage sources, Kinematics, Scattering Cross Sections and Stopping Power.
Surface Analysis of α-Si, µc-Si Thin Film PV
Surface analysis lab techniques on α-Si thin film PV, microcrystalline Si, nanocrystalline Si, amorphous SiGe, & microcrystalline SiC