A Picture is Worth a Thousand Words – TEM, STEM and AC-STEM
TEM, STEM and AC-STEM techniques deliver high resolution images providing a detailed view of a material or product.
Accurate Composition and Quantification of Materials – RBS
RBS is the one technique where we can really say that the composition and concentration are accurately determined for thin films.
Analyzing Red LEDs with PCOR-SIMS
Televisions, computer screens, cell phone screens etc. are getting clearer, sharper, brighter and use much less power. This is all possible through LEDs.
Atom-By-Atom Distance Measurements
In this application note, we show the possibility to extract distance information at an atom-column to atom-column basis with picometer level precision.
High Detection Sensitivity at the Nanoscale Level – APT
APT is a nanoscale materials analysis technique that provides 3D spatial imaging and chemical composition measurements with high sensitivity simultaneously.
LED Analysis
LED characterization, from process control to failure analysis to construction analysis, EAG Laboratories supports your LED analysis needs.
MicroLED Analysis Webinar
In the full webinar we introduce MicroLED Analysis for improved understanding of III-nitride material properties and growth/device processes
When Images Aren’t Enough – EDS and EELS
EDS and EELS can be coupled with SEM, STEM and TEM to determine the elemental composition, spatial distribution and segregation of elements.