Analyses of Modified Glass Surfaces Webinar
In the full webinar we will focus on analyses of modified glass surfaces and thin coatings using Secondary Ion Mass Spectrometry (SIMS).
Analysis of refractory materials
XRD and EDS analysis of refractory materials that are typically used in glass tank furnaces are zirconia, alumina and silica-based bricks.
Ceramic Matrix Composites Emerge as Next Generation Aerospace Materials
One way to combat rising fuel costs in the aerospace industry and improve efficiency is to use new advanced materials such as Ceramic Matrix Composites (CMCs).
Characterization of Bioceramics for Surgical Implants Webinar
In this webinar we introduce Characterization of Bioceramics for Surgical Implants using analytical tools for full qualification
Characterization of Bioceramics for Surgical Implants: Part I – Precursor Qualification
This paper will demonstrate how analytical tools can be used for the quality control of hydroxyapatite and β-tricalcium phosphate powders
Chemical Analysis of Ceramic Matrix Composites
Ceramic matrix composites for aerospace materials must be of the highest purity. EAG presents FF-GDMS technique for robust chemical analysis.
Chemical analysis of glass defects
The chemical composition of all kinds of glass defects can be determined by SEM combined with EDS, XRF, Auger, and RGA.
Chemical Analysis of Plasma Resistant Ceramic Coatings
High resolution GDMS is recognized as one of the most versatile direct sampling techniques for survey chemical analysis of solids.
Chemical Analysis of Plasma Resistant Ceramic Coatings Webinar
In the full webinar we will focus Full Survey Chemical Analysis of
Plasma Resistant Ceramic Coatings using GDMS
Coatings on glass
Investigation of the layer structure, identity and composition of an unknown coating system can be done in several ways.
Compositional analysis of glass and glass products
Glass development and glass product verification requires the measurement of composition with high accuracy.
Evaluation of Cleaning Efficacy
The XPS surface analysis tool ensures evaluation of cleaning efficacy to monitor contamination efficiency.
Glass Analysis Brochure
EAG has unmatched expertise in glass analysis, research and investigation
Glass Analysis Webinar
In the full webinar we will focus on Glass Analysis looking at Chemical and Physical Measurements to address manufacturing issues
Glass defect analysis
Glass faults or defects are inherent to the glass production process. In order to identify a defect, a range of techniques can be used
Glass Delamination in Pharmaceutical Vials Related to Surface Chemical Changes
Application of SIMS, XPS/ESCA, SEM and ICP-MS to test for appearance of glass lamellae in parenteral pharmaceutical solutions, by EAG
Impurity depth direction analysis of various glass materials by SIMS
SIMS analysis is used to measure trace impurities in various materials such as semiconductors, metal, and insulating materials
Ion-Exchanged Glass: Smart Technology for Smartphones
Ion-exchanged glass is used in a variety of applications where strength, durability, and resistance to damage are important. Applications like smartphone screens.
Optical Emission Spectroscopy for Composition Analysis of Complex Oxides
Complex oxides in energy storage, catalysis, sensor/actuation, optics, epitaxy substrates, electronics, bioceramics, structural ceramics
Physical properties of glass
Viscosity is an important parameter for optimized glass processing, such as the viscosity temperature relationship of a glass.
SIMS Analysis of Individual SiC Particles for Accurate Bulk Concentration Measurement
EAG’s SIMS Analysis Individual SiC Particles using a special sample preparation technique eliminates contributions from surface contamination
SIMS Analysis of Nitrogen in Silicon Carbide Using Raster Change Technique
Raster change technique is used for SIMS measurement of very low levels of nitrogen in Silicon carbide by EAG Laboratories.
SIMS Detection Limits of Selected Elements in SiC Under Normal Depth Profiling Conditions
SIMS detection of all elements from H to U with excellent sensitivity. The table provides detection limits for impurities in a SiC matrix.
SIMS Measurements of Silicon Carbide
Silicon Carbide SIMS Measurements provide valuable data for process control and problem solving in wafer growth and device manufacturing.
Ultra-Trace Level Contaminants in materials using ETV–ICP–OES
Electrothermal vaporization (ETV) coupled with ICP-OES is an exceptionally sensitive solid sampling technique for purity verifications.