Poster Presentation at Microscopy & Microanalysis 2024

July 29, 2024

Eurofins EAG Laboratories will be presenting a poster on Machine-Learning Assisted Analysis of Battery Electrode by PFIB-SEM Tomography at Microscopy & Microanalysis in Cleveland, OH. The poster session will be held on Monday, July 29, 2024 from 3:00 – 5:00 pm. This will be part of Symposium A08.P1 – New Opportunities in Material Science – Multi-dimensional Imaging and Advanced Data Processing. We hope to see you there!

M&M 2024

Three-dimensional (3D) characterizations of battery electrodes and active materials are essential to understanding their microstructure. This in turn provides essential insight into the cell performance. During battery cycling, particle morphological change, including cracking and disintegration, can lead to cell degradation. These morphological degradations can range from micrometers to nanometers in scale. Plasma based focused ion beam-scanning electron microscopy (PFIB-SEM) tomography can access representative volume efficiently, while it is able to provide dataset with nm scale spatial resolution and hundreds of µm field of view. Though the tomography techniques are well developed, gaining quantitative information from the representative 3D volume data is still demanding.

In this work, a used commercial lithium-ion battery was disassembled, and its electrode stack was first mechanically cut and polished. Then, a stack of cross-sectional SEM images was collected using a ThermoFisher Helios 5 PFIB UXe. With this dataset, we demonstrated a machine-learning assisted imaging analysis approach to reveal the microstructure and nanostructure of a cathode electrode and individual particles from a lithium-ion battery. Potentially, this method can be applied to understand local heterogeneity within one battery to dig out the cell degradation mechanism. Additionally, it can also be used to compare the particle morphology of the same type of batteries before and after cycling to find out the courses to capacity fade.

Machine-Learning Assisted Analysis of Battery Electrode by PFIB-SEM Tomography

We’ll also be presenting Automated Bandgap Measurements in Optoelectronic Devices by Monochromated Electron Energy-Loss SpectroscopyLearn more!

More content you might like...

TEM

TEM Webinar

In this webinar we will introduce the principles of Transmission Electron Microscopy (TEM) with a focus on real-world problem-solving.

Read More »
SIMS

SIMS Webinar

In this webinar we will focus on Dynamic Secondary Ion Mass Spectrometry which used to investigate the elemental structure of materials.

Read More »

TEM

To enable certain features and improve your experience with us, this site stores cookies on your computer. Please click Continue to provide your authorization and permanently remove this message.

To find out more, please see our privacy policy.