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Home » EAG Metallurgical Experts Investigate Turbine Failure
In the August 2018 Journal of Failure Analysis and Prevention, EAG metallurgical experts Arun Kumar and Syavash Ensha describe their investigation into the causes of an aircraft crash. The article, “Liquid Metal Corrosion Fatigue (LMCF) Failure of Aircraft Engine Turbine Blades” details EAG’s metallurgical failure investigation, and how our scientists determined the reasons for the aircraft engine failure.
After detecting turbine blade failure, our experts discovered fatigue crack initiation, but what caused these cracks? Potential reasons included the age of the aircraft, poor maintenance, pilot error or a manufacturing issue. Read the article to learn how EAG’s metallurgical failure analysis experts discovered the reason for the accident.
EAG’s scientists and engineers use multiple analytical approaches to perform failure analysis for the aircraft, aerospace, transportation, construction and other industries.
Our metallurgical experts apply these approaches to detect fracture and failure modes, fatigue and slow crack growth mechanisms, contamination problems, wear failures, design/stress related failures, corrosion, embrittlement and more. Learn more about EAG’s metallurgical analysis services.
Women in STEM Career Fair Eurofins EAG Laboratories is excited to host a Women in STEM Career Fair on March 31st from 3 PM – 6 PM ET! We’re looking
Alumina is essential not only for its role in aluminum production but also for its durability, thermal stability, and electrical insulation, making it indispensable across these diverse fields.
Highly complex chemistry materials such as geological materials, minerals and ceramics, a specialized sample preparation is used. For these types of materials, fusion sample preparation is used to increase precision and accuracy for data collection.
Electrical AFM can measure the electrical/electromechanical properties of various functional materials and samples. This helps distinguish between conductive and nonconductive areas or polar and nonpolar regions of a device.