
Using ICP-MS to Measure Elemental Compositions in Drug Products
ICP-MS is a multi-elemental bulk chemical analysis technique that can determine simultaneously up to 70 elements in a single sample.
Depending on our clients’ needs, labs within EAG have various certifications, accreditations, regulatory approvals and/or licenses.
For questions about our quality management system, you can reach our quality team here
EAG is committed to excellence in our professional practices, to offering world-class analytical testing services, and to continually improving our quality management system. Our mission to achieve total customer satisfaction by delivering on-time, accurate analyses is engraved in the backbone of our quality system. In keeping with this commitment, we have a number of controls in place to assure the effectiveness and efficiency of our quality system:
Our testing laboratories are registered with the DDTC (Directorate of Defense Trade Controls). A Technology Control Plan is in place to ensure compliance with all EAR (Export Administration Regulations) and ITAR (International Traffic in Arms Regulations). Our scientists and staff are experienced with the data security requirements in regards to EAR, ITAR and military standards.
You may view and download certifications and accreditations for many of our laboratories below.
International Quality Management Standard
International Standard for calibration and testing laboratories
International Quality Management Standard
For DPA and RGA testing at Los Angeles/El Segundo, CA location. Lab is suitably equipped to perform testing on military devices for MIL-STD-750 and MIL-STD-883.
Covering electronic components, assemblies, related materials and processes
ICP-MS is a multi-elemental bulk chemical analysis technique that can determine simultaneously up to 70 elements in a single sample.
Cryogenic focused ion beam and scanning electron microscopy is a technique used to reduce damage caused by ion and electron beams.
This webinar covers FDA regulation of medical devices, the most commonly used test standards, and custom testing at Eurofins EAG Laboratories.
In this webinar we introduce latch-up testing which is relevant for CMOS devices with high static power dissipation.
To enable certain features and improve your experience with us, this site stores cookies on your computer. Please click Continue to provide your authorization and permanently remove this message.
To find out more, please see our privacy policy.