Advanced Microscopy of Compound Semiconductors
In this webinar, we will explore the variety of microscopy techniques available at Eurofins EAG commonly utilized to characterize compound semiconductor materials.
NPE 2024 – The Plastics Show
May 6-10, 2024
Eurofins EAG Laboratories will be attending NPE 2024 – The Plastics show in Orlando, Florida in May. Come visit us at booth W5584 to learn more about our services and capabilities.
We hope to see you there!
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GDMS Webinar
In the full webinar we will focus on full survey chemical analysis using solid sampling high resolution GDMS.
Part 18: Chemical Characterization of Materials
Part 18: Chemical characterization of materials, part of ISO 10993 pertains to evaluating biocompatibility and safety of medical devices.
ICP-OES and ICP-MS Detection Limit Guidance
ICP-OES and ICP-MS detection limit guidance from EAG Laboratories is based on the strengths and limitations of these valuable techniques.
EAG Extends Leadership in Electronics Failure Analysis Services with Millions in New Tool Investments
15th May 2015
Electronics failure analysis services from EAG extended with millions in new tool investments, adding latest precision imaging and inspection equipment.
![SIMS measurement of Bulk [N], Table 1 Long term RSDs for three levels of [N]](https://www.eag.com/wp-content/uploads/2016/10/application-note-SIMS-measurement-of-bulk-N-in-nitrogen-doped-Cz-Si-long-term-precision-results-M-013716_Table_1a-300x150.jpg)
SIMS Measurement of Bulk [N] in Nitrogen-doped Cz-Si: Long Term Precision Results
We have improved the SIMS measurement precision using the ASTM F 2139 test method and extended the detection capability into the 1×1013/cm3 levels.