EDFAS Silicon Valley EFA Workshop: An in-depth look
December 3, 2025
Discover the latest in semiconductor failure analysis through expert presentations and guided lab tours.
NPE 2024 – The Plastics Show
May 6-10, 2024
Eurofins EAG Laboratories will be attending NPE 2024 – The Plastics show in Orlando, Florida in May. Come visit us at booth W5584 to learn more about our services and capabilities.
We hope to see you there!
More content you might like...
Ultra-Trace Level Contaminants in materials using ETV–ICP–OES
Electrothermal vaporization (ETV) coupled with ICP-OES is an exceptionally sensitive solid sampling technique for purity verifications.
Ask the Experts: Materials Characterization of GaN Power Transistors
Demand for compound semiconductors has rapidly grown recently. During this live event we answered questions surrounding the Materials Characterization of GaN HEMT power transistors.
Using MicroXRD to Identify the Composition of Sand
XRD analysis can be used on many scientific and technology-based applications where you may want to identify the crystalline material in a very small area or volume, such as glass defects or inclusions, integrated circuits, LEDs and more.
The Importance of VCSELs in Technological Development
VCSELs have several advantages, such as a higher modulation speed, which make them great for technological innovations.
Design an Effective Chemical Characterization Study for Your Device
May 15, 2024
Check out our online symposium presented by EAG Laboratories and Exponent!