Eurofins Expands with Acquisition of Nanolab Technologies
2nd August 2018
Eurofins Acquires Nanolab Technologies, expanding Materials and Engineering Science verticals cementing presence in high-tech industries.
MEDevice Boston 2024
We are excited to announce Eurofins EAG Laboratories will exhibit at MEDevice Boston September 25-26, 2024, in booth number 642 (Exhibit Level Hall C).
Our team will also co-present with Gradient in the MEDevice Tech Theater at 10:30am ET on September 25.
Presentation Title: Biocompatibility Strategies for Saving Cost and Time When Making a Change to Your Device
Abstract: Material supplier and specification changes during initial and re-assessment of design verification biocompatibility activities can present an additional hurdle for manufacturers, which can result in costly and time-consuming retesting. In this presentation, we discuss how to evaluate biocompatibility material equivalence through leveraging physical and chemical characterization strategies. We incorporate ISO 10993-19 physical, morphological, and topographical (PMT) characterization to reduce the burden of retesting while ensuring enough information to evaluate device safety. Further, we will explain approaches leveraging targeted chemical characterization for equivalency and toxicological risk assessment of extractable chemicals.
View more information about our joint presentation or contact us to learn more about medical device testing solutions.
We hope to see you there!
More content you might like...
SMART Chart Poster Request
The EAG SMART Chart has graced the walls of leading labs and manufacturing companies for the past 25 years.
Secondary Ion Mass Spectrometry (SIMS) Services
SIMS services from EAG is featured in this technique note, including sample data, showing how SIMS detects low concentrations of impurities
High Resolution X-ray Diffraction (HR-XRD) Measurement of Compound Semiconductors
HR-XRD Measurement of Compound Semiconductors can be used to determine the composition of strained layers and thickness.
SIMS Detection Limits of Selected Elements in GaAs Under Normal Depth Profiling Conditions
SIMS Detection Limits OF Selected Elements in GaAs, with detection levels are for normal depth profiling conditions of blanket wafers.
Unveiling the Invisible: An Introduction to Atom Probe Tomography
During this “Ask the Expert” webinar, we dive into the fascinating world of Atom Probe Tomography (APT). Our experts address pre-submitted questions from the audience, focusing on the chemical and structural analysis capabilities of APT.