Characterization of Surface Aluminum Contamination on Processed Silicon Wafers
Surface Aluminum Characterization highlights advantages of using SurfaceSIMS.XP to determine contamination on processed Si wafers.
IRPS 2025 Presentation
March 30 - April 3
We are excited to announce that Eurofins EAG Laboratories will be presenting a poster at the International Reliability Physics Symposium (IRPS) in Monterey, CA, March 30th – April 2nd.
Meet Sinai Galvan as she presents her poster on Wednesday, April 2nd at the Hyatt Regency in Monterey.
Enhanced Dye and Pull for CSP Package Types
Abstract: In this paper, we successfully demonstrate the feasibility of performing Dye and Pull (D&P) Analysis on Chip Scale Package (CSP) types, for which the lab previously experienced structural failure during the pulling process repeatedly which greatly limited the useful information obtained.
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BioInterface 2024
October 2-4, 2024
Eurofins EAG Laboratories will present at the 34th Annual BioInterface Workshop & Symposium.
Coffee & Conversations: Elemental Survey & Contamination Analysis
July 30, 2024
Please join us for coffee and conversations! Enjoy a cup of coffee and refreshments as you get to know our technical experts.
Next Steps After Receiving a Cytotoxic Result
It can be alarming when a product with known components and extensive planning receives a cytotoxic result. Even if the sample was designed with materials marketed to be biocompatible, minor chemical reactions—from production of the raw materials to the packaging or storage of the product—can introduce cytotoxic contaminants.
Identifying Contaminants Using Raman Spectroscopy: Organic Particles
Learning the chemical composition of contaminants is challenging with small organic particles – Raman Spectroscopy is often the best approach