Which method of sectioning is best for my sample?
Cross sectioning of a semiconductor die is a basic step in failure analysis work. A cross section can be used as a check of layer integrity.
IRPS 2025
March 30 - April 3, 2025
We are excited to announce that Eurofins EAG Laboratories will be presenting a poster at the International Reliability Physics Symposium (IRPS) in Monterey, CA, March 30th – April 2nd.
Meet Dr. Daniel Liu as he presents his poster on Wednesday evening, April 2nd from 6:00 – 9:00 pm at the Hyatt Regency in Monterey.
Failure Analysis of Particle Contamination in Battery
Abstract: In this poster, a battery failure analysis process was conducted to identify the root cause of a failed battery. Initially, a 2D X-ray imaging was employed to detect anomalies in the sample. Subsequent disassembly in an argon glove box of the battery facilitated the recovery of particle contaminants. Finally, airless transfer to SEM/EDS allows imaging and elemental analysis of these contaminants revealed the underlying failure mechanism.
Contact us to learn more about our Battery Materials Analysis services.
We hope to see you there!
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