Bay Area Biomedical Device Conference

Medical Device Testing in Europe

Ensuring medical devices are safe, compliant and effective in Europe

NanoIR spectra taken on the contaminant (blue) and from a bulk film of polystyrene (black).

Characterizing Cross Sections and Thin Structures Using NanoIR Spectroscopy

NanoIR is highly suited for identification of organic components that cannot be conventionally analyzed by other organic analysis techniques such as FTIR or Raman.

Secondary Electron image: appearance of defects

Glass Analysis Brochure

EAG has unmatched expertise in glass analysis, research and investigation

Figure 3. XRF Spectrum of Heavy Elements

Characterization of Trace Impurities in 3D-Printed Recycled ABS Materials

Recycled ABS Materials show numerous deleterious effects on molecular integrity of plastic materials, as seen in FTIR, XRF and GPC

Figure 1 DSC Scan of Polyethylene Terephthalate: Heat Flow versus Temperature

Characterization of Polymers using Differential Scanning Calorimetry (DSC)

DSC analysis of polymers provides polymer characterization & thermal properties for product improvement and problem solving.

Metrologies to Study Ion Implanted Semiconductor Materials

28th September 2022
As ion implantation technology for semiconductors evolved, new metrologies to help its progress needed to be developed in parallel. Some of the current metrologies owe their present sophistication to this evolution.