AABC 2022

Stress control in silicon and other semiconductor devices , Figure 1

Semiconductor Stress Measurements by Raman Spectroscopy

Semiconductor stress measurements by Raman Spectroscopy helps control problems related to stress control in semiconductor devices, from EAG.

Evaluation of Cleaning Efficacy

The XPS surface analysis tool ensures evaluation of cleaning efficacy to monitor contamination efficiency.

Analysis of CIGS Thin Film PV

CIGS Thin Film PV performance reliability and uniformity as manufacturing is scaled up, can be optimized using materials characterization.

Boron Carbide for Use in Industrial and Life Saving Products

The elemental purity of boron carbide can be measured using several methods offered by Eurofins EAG Laboratories

EAG supports development of generic drugs

Materials Characterization for Pharmaceuticals

Materials Characterization for Pharmaceuticals EAG has been contacted by pharmaceutical companies to characterize materials and chemistries where the measurements are challenging. We have developed methods for determining API morphology and

Expert witness services from EAG Laboratories for product liability and intellectual property challenges

Product Liability & Patent Infringement Brochure

EAG’s technical consultants bring years of experience investigating failures, interpreting data, and giving expert testimony