2D/3D realtime X-ray inspection solutions
As components get more complex, nondestructive inspection techniques like X-Ray and CT scanning help uncover issues and anomalies
30keV Scanning Transmission Electron Microscopy
30keV Scanning Transmission Electron Microscopy (STEM) can provide 3Å resolution bright field (BF) and dark field (DF, ADF, HAADF) images
3D Confocal Raman Imaging of Pharmaceutical Creams and Tablets
A very good use of Raman is for the analysis of pharmaceutical products to determine the spatial distribution of components of interest
A materials analysis study into FinFET technology
We provide a materials analysis study into the comparison between 22 nm node and 7 nm node FinFET technologies, using TEM-based techniques.
A TEM-based Materials Analysis Study into 22nm FinFET Technology
A study into the structure, elemental distribution and crystal orientation of a 22nm FinFET using TEM based analysis techniques
Aberration Corrected Scanning Transmission Electron Microscopy (AC-STEM) Services
Aberration Corrected Scanning Transmission Electron Microscopy (AC-STEM) significantly improves the resolution of the traditional STEM tools.
Additive Manufacturing (3D Printing): Metallurgical and Material Services
Additive manufacturing is transforming how products and parts are manufactured that in more cost-effective solution.
Additive Manufacturing: Analysis Along the Entire Value Chain
Additive Manufacturing (3D printing) enables the creation of products with freedom in design and choice of polymers, metals, and ceramics.
Advanced Materials and Processes Pose Tough Challenges for Electronic Systems Failure Analysis
Electronic systems failure analysis methodology and workflow by applying FIB circuit edit techniques for solving electronic problems.
Advanced Surface Analysis for Problem-Solving in Flat Panel Display Manufacturing
Advanced Surface Analysis using TOF-SIMS on a flat panel display, discovering residue formed during the manufacturing process.
Advancing Semiconductor Failure Analysis: Eurofins EAG’s Plasma FIB Delayering
At Eurofins EAG Laboratories, we have utilized Plasma Focused Ion Beam (PFIB) to overcome the limitations of traditional deprocessing methods.
AFM Polymer Surface Modification
Polymer surface modification by Atomic Force Microscopy (AFM) for understanding surfaces of medical device polymers for biocompatibility.
Alkali Contamination in Thin Dielectric Films
Alkali contamination can compromise performance of oxide and other dielectric layers in electronic devices.
Alloy Characterization using Wavelength Dispersive X-Ray Fluorescence Spectroscopy
Wavelength Dispersive X-Ray Fluorescence Spectroscopy (WDXRF) is an ideal analytical tool for determining or verifying alloy compositions
Analysis of CIGS Thin Film PV
CIGS Thin Film PV performance reliability and uniformity as manufacturing is scaled up, can be optimized using materials characterization.
Analysis of Contaminants by Thermal Desorption GC-MS
Thermal desorption GC/MS – Good vs. failed comparisons for detecting volatile organic components and for semi-quantitative results.
Analysis of refractory materials
XRD and EDS analysis of refractory materials that are typically used in glass tank furnaces are zirconia, alumina and silica-based bricks.
Antifouling Paint Release Testing
Antifouling Paint Release Testing is a product chemistry specialty, to determine the release of biocides from marine paint coatings.
Assessing Local Polarity in III-Nitrides Using AC-STEM
In this application note, we show how different signals obtained through AC-STEM can provide direct observation of local polarity switching.
Assessing Nickel Leaching on Cardiovascular Stents
EAG evaluate corrosion and leaching of nickel-rich implanted medical devices including nitinol, stainless steel and MP35N.
Assessment of Nickel Exposure Risk of Intravascular Stents and Delivery Systems
Nickel biocompatibility assessments of intravascular stents from EAG includes evaluating corrosion, surfaces and nickel ion release testing.
ASTM Testing Lab
Our extensive list of test methods in our ASTM testing lab for paints, coatings, adhesives and plastic manufacturers.
Atom-By-Atom Distance Measurements
In this application note, we show the possibility to extract distance information at an atom-column to atom-column basis with picometer level precision.
Atomic Elemental Mapping by Simultaneous Dual EELS and EDS
EELS and EDS coupled with STEM provides chemical composition along with structure information of materials.
Atomic Elemental Mapping of Lithium-ion Materials by EELS
With the demand of lithium-ion batteries, it is critical to understand the structure and composition with high spatial resolution.
Atomic Layer Deposition (ALD) Analysis
Atomic layer deposition analysis helps you meet ALD specifications for composition, thickness, and crystallinity.
Atomic Resolution EDS
Advances in thin film growth has created a need for characterizing structure and chemistry at the atomic scale using EDS.
Atomic-Resolution Secondary Electron Imaging
AC-STEM with Secondary Electron (SE) imaging provides the unique capability of evaluating specimen surface morphology with atomic-resolution.
Auger Electron Spectroscopy (AES) Tutorial
Auger Tutorial by EAG, in this instrumentation overview we present the history of Auger, along with details regarding analyzers and detectors
Automatic Critical Dimension Measurements Enabled by Deep Learning
In this application note, we highlight how deep learning methods for image segmentation, such as convolutional neural networks (CNNs) or vision transformers, can help interpret the complex contrast of TEM images and segment a series of thin films in 3D NAND devices.
Battery Analysis after Application/Use
Eurofins EAG Laboratories is your partner for battery materials testing throughout the battery life cycle. From raw materials to product failures, we can provide the data needed to help you provide top quality and high-performance products to market faster.
Battery Analysis during the Manufacturing Process
Assessing the chemical state of various components of a battery, from the cathode to the current collectors, at different stages of cycling, provides crucial insights into the electrochemical processes that occur during battery operation.
Battery Raw Material Testing
Battery Raw Materials Analysis Battery manufacturing is a meticulous process where the integrity and performance of the final product hinge on the purity of its
Battery Recycling Services
Battery recycling of key materials such as cobalt, nickel, and lithium require precise and accurate determination of elemental compositions
Battery Technology
Battery materials characterization services includes analysis of raw materials, surface chemistry, composition, morphology and uniformity
Biomedical Applications of AFM: Imaging Hydrogel Coatings
Atomic Force Microscopy, AFM imaging helps medical device manufacturers understand how coatings behave when applied to a medical device surface.
Biomedical Morphology
Biomedical Morphology and Microstructure through imaging analysis – characterizing crystallographic phase and producing elemental maps.
Biomedical Products
Biomedical products analyzed by EAG Laboratories include stents, catheters, balloons, implants, lens, diagnostics and more
Biomedical Surface Analysis
Biomedical surface analysis looks at properties critical to medical and pharmaceutical products, and offer answers to difficult problems.
Catheter and Balloon Analysis
Catheter and balloon analysis for medical device development support includes deformulation, contaminant identification and failure analysis.
Cause and Location of Delamination of Multi-layer Metal Foil by XPS
Laminate failure : Multi-layer laminate by analysis by XPS. Investigation details adhesive failure at a Ni2Mo-Cu interface due to monolayer contamination.
CdTe Thin Film PV – Application Discussion
CdTe Thin Film PV manufacturers benefit from surface analysis techniques such as SIMS, GDMS, SEM,TEM to support efficiency improvements.
Characterization of Beach Sand Using WDXRF and XRD
WDXRF and XRD are two powerful tools that allow us to obtain detailed characterization of materials, covering both the elemental composition and crystalline phases present.
Characterization of Bioceramics for Surgical Implants: Part I – Precursor Qualification
This paper will demonstrate how analytical tools can be used for the quality control of hydroxyapatite and β-tricalcium phosphate powders
Characterization of materials used in stents
Stents characterization from EAG includes nitinol, stainless steel and MP35N. Experiences with fatigue resistance and hydrogen embrittlement.
Characterization of Polymers using Differential Scanning Calorimetry (DSC)
DSC analysis of polymers provides polymer characterization & thermal properties for product improvement and problem solving.
Characterization of Polymers using Dynamic Mechanical Analysis (DMA)
Polymeric materials characterization: Dynamic mechanical analysis (DMA) to study viscoelastic properties under conditions of low applied mechanical force.
Characterization of Surface Aluminum Contamination on Processed Silicon Wafers
Surface Aluminum Characterization highlights advantages of using SurfaceSIMS.XP to determine contamination on processed Si wafers.
Characterization of Surface Contamination
A discussion of EAG’s elemental characterization of defects and contamination on surfaces for failure analysis through EDS, SEM and AES.
Characterization of Surface Metallic Contamination
To identify and quantify contaminants, utilizing both TXRF and SurfaceSIMS.XP provides surface measurements on semiconductor surfaces.
Characterization of Trace Impurities in 3D-Printed Recycled ABS Materials
Recycled ABS Materials show numerous deleterious effects on molecular integrity of plastic materials, as seen in FTIR, XRF and GPC
Characterizing Annealed ULE B Implants
EAG’s PCOR-SIMS methodology includes point-to-point correction resulting in the most accurate SIMS profiling yet for ultra shallow implants.
Characterizing Cross Sections and Thin Structures Using NanoIR Spectroscopy
NanoIR is highly suited for identification of organic components that cannot be conventionally analyzed by other organic analysis techniques such as FTIR or Raman.
Chemical Analysis of Ceramic Matrix Composites
Ceramic matrix composites for aerospace materials must be of the highest purity. EAG presents FF-GDMS technique for robust chemical analysis.
Chemical analysis of glass defects
The chemical composition of all kinds of glass defects can be determined by SEM combined with EDS, XRF, Auger, and RGA.
Chemical Analysis of Materials Used in Lithium Ion Batteries
Chemical analysis techniques that can help to evaluate the composition of materials that are used for manufacturing Lithium Ion Batteries
Chemical Analysis of Plasma Resistant Ceramic Coatings
High resolution GDMS is recognized as one of the most versatile direct sampling techniques for survey chemical analysis of solids.
Chemical Decapsulation
Chemical Decapsulation: Creation of a cavity on the package surface of an electronic component to expose the die underneath for inspection.
Chemical Imaging of Pharmaceuticals
The chemical imaging of drug products helps to understand location/distribution of organic & inorganic constituents for formulation and IP
Chemicals & Basic Materials Testing
EAG evaluates chemicals & basic materials, helping to improve manufacturing, meet regulations, enhance research and resolve safety concerns.
Cleanroom Materials as Sources of Airborne Molecular Contamination
Airborne molecular contamination in cleanrooms lead to AMC defects in the electrical properties of wafers: Analysis by FTIR, GC/MS,TOF-SIMS .
Coatings & Adhesives
EAG’s coatings testing lab provides deformulation, VOC EPA 24 testing, and other ASTM paint evaluations for product improvement and troubleshooting.
Coatings on glass
Investigation of the layer structure, identity and composition of an unknown coating system can be done in several ways.
Comparison between EDS and EELS
EDS and EELS are elemental analysis techniques integrated with electron microscopes such as TEM (Transmission Electron Microscope)
Compositional analysis of glass and glass products
Glass development and glass product verification requires the measurement of composition with high accuracy.
Confronting Contamination Analytical Case Studies
Contamination of great concern to the pharmaceutical and medical device industry, two case studies illustrate investigative approach.
Consumer Product Testing
EAG helps consumer products manufacturers build better by accelerating product innovation, improving raw materials & meeting all regulations.
Contact Lenses: Understanding Surface Chemistry Critical to Optimizing Design
EAG Laboratories helps you understand contact lenses surface chemistry, critical to optimizing design and engineering optimal performance.
Corrosion Resistance Study of Electropolished Medical Devices
Medical device corrosion resistance optimized by using Auger depth profile & oxide layer thickness for device surface characterization.
Cryogenic Focused Ion Beam
Cryogenic Focused Ion Beam (Cryo-FIB) uses traditional FIB techniques, but with a sample stage that can be controlled to -135°C.
Crystallite size determination using XRD
XRD analysis shows the crystallite size can be evaluated at half maximum of a diffraction peak as the crystallite size decreases.
Depth Profile Characterization of Low-K Materials Using Secondary Ion Mass Spectrometry
SIMS depth profile characterization provides accurate quantification for all measured species and matrix using our unique reference materials
Depth Profiling of Thin Organic Films
Cellphone screens are quite vulnerable to damage and are often protected with with a thin oleophobic coating.
Determination of Flame-retardant Materials
Flame retardant materials determination – learn how our experts help understand this important product’s composition in this white paper
Determining Density of Thin Films
Thin films are widely used in many high-tech devices & consumer products. We discuss the processes used to measure the density of such films.
Dye & Pry
Dye and Pry is an excellent way to inspect a large number of bonds (leads, solder ball, seals..) at one time
EAG’s Nanoprobing Capabilities: Enhanced Analysis and Failure Detection
Nanoprobing is a highly specialized analytical technique used in semiconductor physics and electronics industries.
Electrical Localization Capabilities using QFI Infrascope
QFI Instrument Services and electrical localization services from EAG Laboratories are upgraded with LSM and XIVA image.
Electrolytes in Drinks
Electrolytes are minerals that carry an ionic charge when dissolved in solution. EAG can identify and quantify using Ion Chromatography (IC).
Element Determinations in Photovoltaic (PV) Grade CdTe/CdS Powders
Photovoltaic Element Determinations by GDMS is ideally suited for trace element monitoring of PV grade CdTe/CdS materials.
Evaluating Electropolished Stainless Steel for Gas Distribution
Evaluating Surface and Oxide Composition of Electropolished Stainless Steel for High-Purity Gas Distribution Systems
Evaluating Epitaxy Quality in Compound Semiconductors Using AC-STEM/EDS
Fine control over structural and compositional uniformity during epitaxial growth of compound semiconductors is critical for developing reliable and efficient devices.
Evaluation of Cleaning Efficacy
The XPS surface analysis tool ensures evaluation of cleaning efficacy to monitor contamination efficiency.
Evaluation of Dislocation Type in GaN Using STEM
Threading dislocation evaluation of dislocation type in GaN using STEM (AN463) by EAG Laboratories supports LED development and quality.
Evolved Gas Analysis with Thermogravimetric Analysis (TGA-MS)
TGA with hyphenated technologies such as infrared (IR) and/or mass spectrometry (MS) is investigates the outgassing behavior of materials
Excluded Compound Testing
Exclusion Testing for Material Compliance Regulations of Medical Device Components has multiple regulating bodies.
Extractable and Leachable Database Building for High Confidence Identification by Liquid Chromatography-Mass Spectrometry
Through database building, EAG provides higher-quality chemical characterization reports with reduced turnaround times to support medical device biocompatibility programs.
Failure Analysis of Metals, Nonmetals & Composites
Failure analysis metals, nonmetals and composites for aircraft, aerospace, transportation, construction, consumer products, and electronics.
Failure Analysis of Microelectronic Products and Systems
EAG Laboratories has the engineering expertise and advanced equipment and tools for microelectronic failure analysis of products and systems.
Failure Analysis of Printed Circuit Boards (PCB)
With in-depth images and analyses, EAG is able to examine the root cause of failures, critical dimensions, and quality of assembly process. Our experts can assist in PCB improvement.
Failure Inspection Post Reliability Stress
Failure inspection during post reliability stress testing to ensure no delamination, voids, cracks, material density changes.
Fluid Imaging AFM of Cellulose Bio-membranes
Atomic Force Microscopy (AFM) is used analytical technique for characterizing bio-membrane topography because it can be performed in fluid.
Focused Ion Beam (FIB) Circuit Edit Becomes Increasingly Valuable in High-Stakes World of Advanced Node Design
Focused Ion Beam (FIB) circuit edit techniques and FIB applications to help develop and improve IC design and advanced process nodes
Food & Beverage Testing Services
Food testing services from EAG includes off-odors, off-taste, packaging interactions, extractables and leachables & materials identification
Food Contaminant Identification
Food contaminant and beverage contaminant identification requires a strategic analytical approach using control and suspect sampling.
Food Investigations and Crisis Management
EAG experts guide manufacturers, processors and distributors through food investigations and help save time and money in crisis management.
Fourier Transform Infrared Spectroscopy (FTIR) Services
FTIR Services information from EAG Laboratories includes typical data, principles, strengths and limitations from our FTIR lab.
Fracture Analysis of Metal Grain Boundary Segregation by Auger
Characterization of metallurgical failures includes identifying segregation of elemental impurities to the surface of grain boundaries.
FTIR and Contact Angle Measurements of Surface Modified Polymers
Fourier Transform Infrared Spectroscopy (FTIR) is a analytical technique for characterizing organic and some inorganic materials
Full Wafer Particle Analysis of sub-50nm Defects by Auger Electron Spectroscopy
Auger (AES) spectra of small defects of various sizes shows excellent sensitivity is maintained down to a defect size of only 20nm.
Glass defect analysis
Glass faults or defects are inherent to the glass production process. In order to identify a defect, a range of techniques can be used
Glass Delamination in Pharmaceutical Vials Related to Surface Chemical Changes
Application of SIMS, XPS/ESCA, SEM and ICP-MS to test for appearance of glass lamellae in parenteral pharmaceutical solutions, by EAG
Glow Discharge Mass Spectrometry (GDMS) Services
Glow discharge mass spectrometry (GDMS) is a robust analytical technique for direct determinations of elemental compositions of samples.
GLP Characterization Studies
GLP characterization studies of test and reference materials by EAG Laboratories supports your regulatory compliance goals
GMP, GLP or ISO 17025: How Do These Apply to Outsourced Analytical Testing?
Medical device regulations are not entirely clear, EAG shows the decision process for contract analytical laboratories to support development.
High Depth Resolution SIMS Profiles for Compound Semiconductor Devices
Measurement of dopant & impurity concentrations in compound semiconductors by SIMS with low detection limits & excellent depth resolution.
High Resolution X-ray Diffraction (HR-XRD) Measurement of Compound Semiconductors
HR-XRD Measurement of Compound Semiconductors can be used to determine the composition of strained layers and thickness.
High Resolution XRD – Epitaxial film composition
How to determine the composition of epitaxial thin films by X-ray diffraction and will focus on the analysis of AlxGa1-xAs thin films.
How Clean is Your Reliability Chamber?
A concern with Stress testing of electronic devices is the potential contamination of devices by a poorly maintained or cleaned chamber.
How do you shape tomorrow’s aviation?
EAG Laboratories has the skills and experience to analyze and troubleshoot every step of the aerospace flight process
How to Evaluate Manufacturer-Provided Extractable Information
Manufacturer-provided extractable data must be questioned and evaluated for your specific application. We outline the steps and questions.
How to interpret TOF-SIMS spectra
TOF-SIMS is a technique that can observe elemental, inorganic and molecular species present on the outermost surface of a sample
Hydrogen, Carbon, Oxygen and Iron Contamination Measurements in ALD Films using XPS and SIMS
ALD for semiconductors can produce films that are high in H, C, O and metals. XPS and SIMS depth profile analysis for composition & purity.
ICP-OES and ICP-MS Detection Limit Guidance
ICP-OES and ICP-MS detection limit guidance from EAG Laboratories is based on the strengths and limitations of these valuable techniques.
Identification of Foreign Material on Pharmaceutical Tablets
SEM-EDS and RAMAN analytical testing laboratory techniques applied to identification of foreign material contamination on pharmaceuticals.
Identification of Interface Contamination Using Auger Electron Spectroscopy (AES)
Auger Identification Interface Contamination is discussed regarding the elimination of contaminants for successful semiconductors.
Identification of Unknown Powders
This paper describes identification of two unknown powders using Raman spectroscopy, combined with two X-ray techniques
Identifying Contaminants Using Raman Spectroscopy: Organic Particles
Learning the chemical composition of contaminants is challenging with small organic particles – Raman Spectroscopy is often the best approach
IGA Fractional O/N/H Analyses of Powder Feedstocks for Additive Manufacturing
Additive manufacturing calls for powder feedstock of metals, alloys and ceramics, with particle size typically in 100s nm – 10s μm range.
III-V Multi-Junction PV – Application Discussion
III-V solar cell technology for concentrator PV systems is the focus of this app note, illustrating the way that surface analysis can help
Imaging Cross-Sections by TOF-SIMS
Imaging Cross-Sections by TOF-SIMS provides molecular information with high spatial resolution for the distribution of organic molecules
Implementing Extractables and Leachables into Quality Control Testing Programs
E&L methods pose challenges as they transition from R&D environment to routine QC testing. Understanding these challenges will help you avoid costly delays.
Improving Performance and Safety of Lithium-Ion Batteries: Characterizing Materials and Interfaces
Battery characterization improves lithium-ion battery safety and performance using techniques such as SEM, TEM, XPS, GDMS, FTIR, ICP-OES, Raman and failure analysis
Impurity depth direction analysis of various glass materials by SIMS
SIMS analysis is used to measure trace impurities in various materials such as semiconductors, metal, and insulating materials
Impurity Identification & Characterization
EAG performs contaminant investigations and impurity identification across major dosage forms and delivery systems, such as unit dose vials.
In Vitro Diagnostics Testing
In Vitro Diagnostics test and system development support from the materials sciences experts at EAG Laboratories, contact us today!
Inductively Coupled Plasma (ICP) Services
EAG offers comprehensive compositional analysis services, including “full scan” measurements of up to 69 elements, through its suite of Inductively Coupled Plasma (ICP) Analytical Techniques.
Industrial Goods Testing and Analysis
Industrial goods testing from EAG helps companies create innovative materials and troubleshoot problems with industrial chemical products.
Ingress Protection (IP) Testing – Ingress of Water and Dust
The type and degree of ingress protection that an enclosure possesses is described by the Ingress Protection (IP) rating.
Instrumental Gas Analysis (IGA) Services
IGA Services from EAG Laboratories measures gas-forming elements (C, H, O, N and S) in samples from ppm to percentage levels.
Interface and Abruptness Characterization of Si/SiGe Superlattice Epitaxial Films
The process of applying both PCOR-SIMSSM and STEM imaging to the same Si-SiGe multilayer sample demonstrates the individual strengths of both techniques and how they can be combined to form a complete understanding of the sample.
Is there proof that your hand sanitizer is effective?
EAG is equipped with the necessary tools and techniques to examine hand sanitizer gel products for their primary ingredients
Laboratory and Testing Support for Companies Manufacturing Medical Supplies to Fight COVID-19 (Coronavirus)
Respiratory protection testing, cleaning compatibility, sanitizing liquids and wipes, supply chain and manufacturing quality, failure analysis
Laser Ablation-Inductively Coupled Plasma-Mass Spectrometry (LA-ICP-MS) Services
LA-ICP-MS is an analytical technique that uses direct micro-scale sampling to provide high precision elemental and stable isotope analyses of solid maters
Laser Decap at EAG
Laser decap at EAG Laboratories includes our Failure Analysis Laser Inspection Tool, view our picture book of PC boards before and after.
LED Analysis
LED characterization, from process control to failure analysis to construction analysis, EAG Laboratories supports your LED analysis needs.
Level 1 Failure Analysis
Level 1 Failure Analysis includes: non-destructive tests optical inspection, X-ray, C-SAM, and electrical characterization.
Liquid Chromatography Tandem Mass Spectrometry LC-MS-MS
LC-MS-MS from EAG combines the separating power of liquid chromatography with the mass analysis of triple quadrupole mass spectrometry.
Low Parasitic HBM Testing
HBM ESD testing (Human Body Model electrostatic Discharge) uses the latest standards and best testing practices, reducing costs and time.
Material Reliability Test of PLA Polymer Degradation
This App Note shows the approach of EAG Laboratories to test the material reliability of PLA Polymer Degradation
Material structural analysis power of PED at nanometer scale
Examples of crystal grain orientation mapping and strain mapping in 7nm EUV technology IC chip and strained Silicon
Materials Characterization for Pharmaceuticals
Materials Characterization for Pharmaceuticals EAG has been contacted by pharmaceutical companies to characterize materials and chemistries where the measurements are challenging. We have developed methods
Mechanical Testing
Mechanical testing incorporates the measurement of the material’s mechanical response to an applied force or displacement
Medical Device & Diagnostics for BIOMEDevice
Drive productivity while keeping pace with evolving regulations
Medical Device Electronics: Improving Reliability with Auger Electron Spectroscopy
Auger Electron Spectroscopy applied to electronic circuitry problems involving the integrity of wire or ball bonding to metallic bond pads.
Medical Devices and Diagnostics
Device concept and medical device researchers need materials answers quickly so the can proceed with device development. Ask EAG!
Metallurgical Testing
Metallurgical testing lab services from EAG Laboratories includes grain size analysis, Rockwell hardness and image analysis.
Microwave Induced Plasma decapsulation
Microwave-Induced-Plasma (MIP) decapsulation allows for damage free removal of the protective cover of semiconductor packages.
MicroXRD: Small Area Analysis of Single Grains of Sand
Microdiffraction can be used to identify crystalline inclusions in glass, look at film texture in a test pad on an integrated circuit, identify a single particle found in an air filter, or to identify the phosphor used in an LED.
MicroXRR & MicroHRXRD
EAG has a new XRD/XRR instrument to help our clients solve challenging problems that require the analysis of small areas or volumes.
Mining Materials Analysis
Mining materials analysis services include inorganic analysis, materials identification, failure analysis, and trace metal analysis
Multilayer Packaging Film Characterization
Understanding the construction/composition of films is beneficial for a variety of reasons
Multiscale assessment on the quality of metal powder feedstocks for additive manufacturing
Additive manufacturing produces parts with geometric complexity, material composition gradient control, and lightweight structure design.
New Oxide-Specific Relative Sensitivity Factors to Improve Non-Conductive Oxide Materials Analysis by GDMS
Glow discharge mass spectrometry (GDMS) relies on relative sensitivity factors (RSFs) in order to convert ion beam ratios of elements into mass fractions.
New ultra high-power burn-in
EAG has success executing burn-in programs for new product qualifications to conducting Early-Life Failure Rate studies.
Next Steps After Receiving a Cytotoxic Result
It can be alarming when a product with known components and extensive planning receives a cytotoxic result. Even if the sample was designed with materials marketed to be biocompatible, minor chemical reactions—from production of the raw materials to the packaging or storage of the product—can introduce cytotoxic contaminants.
Optical Emission Spectroscopy for Composition Analysis of Complex Oxides
Complex oxides in energy storage, catalysis, sensor/actuation, optics, epitaxy substrates, electronics, bioceramics, structural ceramics
Optical Profilometry Roughness Measurements on Machined Parts
Characterizing surface topography is possible with a technique called Optical Profilometry (OP) also known as White Light Interferometry.
Optimizing 2-D Electron Density in pHEMTs Using Secondary Ion Mass Spectrometry
pHEMT device analysis by SIMS improves device performance and aids in failure analysis of III-V high-speed transistor structures.
Organic Contamination on Surfaces
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) detects organic contamination on surfaces of semiconductors.
Orthopedic Implants
Orthopedic implants composed of metallurgical alloys, plastics and critical surface chemistries require characterization
Package Delayering Services
Package Delayering services helps to look for opens, shorts, leakage and damage in the layers and design rule distances in the sample.
Packaging Analysis
EAG provides packaging analysis and innovation by combining analytical chemistry, polymer expertise and specialized microscopy techniques
Part 18: Chemical Characterization of Materials
Part 18: Chemical characterization of materials, part of ISO 10993 pertains to evaluating biocompatibility and safety of medical devices.
Particle Analysis Services
Particle analysis helps with black speck analysis, contamination identification, particulate analysis, identification of unknown materials.
Particle Size Characterization
Particle size is an important parameter for many industrial processes
PCOR-SIMS Analysis of GaN HEMT Epitaxial Layers Grown on Silicon Substrates
Point-by-Point Corrected SIMS (PCOR-SIMS) can determine accurate concentrations of matrix elements and dopants in GaN HEMTs.
Performing Reliability Qualification Testing On CSP Without Damaging Devices
Solving CSP qualification testing challenges by addressing key issues and applying specialized processes through EAG know-how.
Personal Care – Cosmetic purity and safety testing
EAG provides advanced testing to assist personal care and cosmetics brands, from deformulation to packaging studies to litigation support
Physical properties of glass
Viscosity is an important parameter for optimized glass processing, such as the viscosity temperature relationship of a glass.
Pigmented contact lenses
The contact lens market has expanded beyond its original goal of vision correction to include products with decorative qualities.
Plastic Deformulation
Plastic deformulation studies help identify and quantify pigments, polymers, resins, impact modifiers, stabilizers and more in your products.
Point-by-Point CORrected-SIMS (PCOR-SIMS) Services
PCOR-SIMS is an EAG proprietary technique that can measure layer thickness, composition, and doping profiles.
Polymer and Plastic Testing
Plastic testing services from EAG offers insight into thermoplastics, elastomers, thermosets, specialty polymers, polyurethanes, coatings.
Process to Successfully Perform Dye & Pry of CSP Devices
The common method of dye & pry can result in the cracking and shattering of die. EAG has altered the common dye & pry method, which has resulted in a significantly improved success rate.
Product Chemistry
EAG offers product chemistry services: physical and chemical analyses to characterize active ingredients, product components and degradants.
Product Reliability Test of a Bluetooth Speaker
EAG has established product reliability test processes. In this example we inspect a Bluetooth speaker using Accelerated Testing.
Quadropule Ion Trap (QTrap)
Quadropule Ion Trap (QTrap) The quadropule ion trap (QTrap) is a particular type of triple quadrupole mass spectrometer. Please refer to LC-MS-MS for a discussion
Quantification of Active Pharmaceutical Ingredients by XPS
API Quantification on the Surface of Pharmaceuticals can be done by X-ray Photoelectron Spectroscopy (XPS) from EAG Laboratories.
Quantification of Bisphenol A
BPA analysis to quantify Bisphenol A levels in products using proprietary analytical methods using HPLC with a flourescence detector.
Quantification of Ultrathin Layers by AC-STEM-EDS
AC-STEM-EDS analysis is explored showing the effectiveness of this technique for characterizing ultrathin layers.
Quantitative Determination of Nonylphenol Ethoxylates
This method is for the quantitative determination of nonylphenols and nonylphenol ethoxylate (NPEs) by LC-MS.
Rapid Threading Dislocation Typing in GaN Using STEM
STEM provides images of dislocations with simplified contrast, allowing rapid dislocation typing in both cross section and plan view samples.
Reducing System Failure Costs in Today’s Digitally Dependent World
Electronic system failure analysis requires expertise in the modes of failures and techniques such as SEM, TEM, and dual-beam FIB.
Residual Solvents in Medical Devices
Detecting Levels of residual solvent concentrations in medical devices with Dynamic headspace Gas Chromatography-Mass Spectromety (GC-MS)
Reverse Engineering of Compound Semiconductor Optoelectronics
When information is required from a compound seminconductor, EAG can depackage and deprocess the sample, & fully characterize it.
Reverse Engineering of Pharmaceuticals
Reverse engineering projects yield data regarding API & excipients for the development of generic formulations & resolving legal challenges.
Root Cause Determination of Adhesion Failure in Medical Device Packaging
XPS and TOF-SIMS to solve adhesive failure of a polyethylene-ethylene acrylic acid (co-polymer) heat seal to polyethylene in a medical device.
Rutherford Backscattering Spectrometry (RBS) Services
View typical RBS services results from EAG used for compositional thin film analysis for semiconductors, optimal coatings and more.
Rutherford Backscattering Spectrometry (RBS) Tutorial
RBS Tutorial from EAG includes discussion of tandem accelerators, voltage sources, Kinematics, Scattering Cross Sections and Stopping Power.
Sampling of Fe in CIGS, Solar Cell Using Large Area SIMS
Impurities adversely affect performance of a CIGS solar cell, with varying concentrations – SIMS can help measure representative sampling.
Scanning Capacitance Microscopy (SCM) of a Power MOSFET
SCM provides doped region distribution mapping, profiling and dimensional analysis for the research and development, failure analysis and quality control of electronic components.
Scanning Electron Microscopy (SEM)/ Energy Dispersive X-ray Spectroscopy (EDS)
SEM coupled with EDS provides high-resolution and high-depth-of-field images of
the sample surface along with elemental identification.
Scrutinizing VCSELs by SIMS
An advanced form of SIMS, PCOR-SIMS identifies dopants, impurities, compositions and thicknesses in various layers of VCSELs
Secondary Ion Mass Spectrometry (SIMS) Services
SIMS services from EAG is featured in this technique note, including sample data, showing how SIMS detects low concentrations of impurities
Secondary Ion Mass Spectrometry (SIMS) Tutorial
SIMS tutorial from EAG Laboratories includes SIMS primary ion sources, ion energy analyzers, Sputtering and elemental effects
Secondary Ion Mass Spectrometry Survey Depth Profile
Survey-SIMS Depth Profiles analyze for dopants & impurities in a material without having prior knowledge in the structure being evaluated.
Self-assembled Monolayers
Self-Assembled Monolayers (SAMs) are used in molecular recognition, surface engineering, micro-contact printing and molecular electronics.
Semiconductor Stress Measurements by Raman Spectroscopy
Semiconductor stress measurements by Raman Spectroscopy helps control problems related to stress control in semiconductor devices, from EAG.
Services for the Aerospace and Defense Industries
EAG has support Aerospace and Defense customers for over 50 years
Services for the Automotive Industry
For over 40 years EAG has supported the Automotive Industry
Silicon Wafer PV – Application Discussion
Silicon wafer solar cells and the analytical techniques used to investigate failures, bulk defects and other materials characterization.
SIMS Analysis of Al and Ga Diffusion
SIMS detects very low concentrations of dopants and impurities. It has been used to study the diffusion of Al and Ga.
SIMS Analysis of Individual SiC Particles for Accurate Bulk Concentration Measurement
EAG’s SIMS Analysis Individual SiC Particles using a special sample preparation technique eliminates contributions from surface contamination
SIMS Analysis of Nitrogen in Silicon Carbide Using Raster Change Technique
Raster change technique is used for SIMS measurement of very low levels of nitrogen in Silicon carbide by EAG Laboratories.
SIMS Analysis Tips – What is the effect of mass interference?
Secondary ion mass spectra measured by SIMS may not always provide information from the target element alone.
SIMS Detection Limits of Selected Elements in GaAs Under Normal Depth Profiling Conditions
SIMS Detection Limits OF Selected Elements in GaAs, with detection levels are for normal depth profiling conditions of blanket wafers.
SIMS Detection Limits of Selected Elements in GaN Under Normal Depth Profiling Conditions
SIMS Detection Limits of Selected Elements in GaN. Normal depth profiling conditions, blanket wafers. Detection levels depends on area.
SIMS Detection Limits of Selected Elements in HgCdTe Under Normal Depth Profiling Conditions
SIMS analytical technique typical detection limits for impurities in a HgCdTe matrix for normal depth profiling conditions.
SIMS Detection Limits of Selected Elements in InP Under Normal Depth Profiling Conditions
SIMS Detection Limits of Selected Elements in InP for impurities in InP matrices with normal depth profiling conditions.
SIMS Detection Limits of Selected Elements in Si and SiO2 Under Normal Depth Profiling Conditions
SIMS Detection Limits of Selected Elements in Si and SiO2 Under Normal Depth Profiling Conditions SIMS is a powerful analytical technique which allows detection of all
SIMS Detection Limits of Selected Elements in Si Under Bulk Analysis Conditions
SIMS detection limits of selected elements in Silicon, providing a a list of detection limits for typical dopants and impurities
SIMS Detection Limits of Selected Elements in SiC Under Normal Depth Profiling Conditions
SIMS detection of all elements from H to U with excellent sensitivity. The table provides detection limits for impurities in a SiC matrix.
SIMS Detection Limits of Selected Elements in ZnO Under Normal Depth Profiling Conditions
SIMS ZnO detection limits of selected elements under normal depth profiling conditions, showing overlay of SIMS profiles of arsenic implant
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SIMS Measurement of Bulk [N] in Nitrogen-doped Cz-Si: Long Term Precision Results
We have improved the SIMS measurement precision using the ASTM F 2139 test method and extended the detection capability into the 1×1013/cm3 levels.
SIMS Measurements of Silicon Carbide
Silicon Carbide SIMS Measurements provide valuable data for process control and problem solving in wafer growth and device manufacturing.
SIMS: Do You Remember When a Factor of 2 Was Good Enough?
A paper on the early days of SIMS quantification and its evolution throughout the years.
SMART Chart Poster Request
The EAG SMART Chart has graced the walls of leading labs and manufacturing companies for the past 25 years.
Solar/PV Testing
EAG provides solar industry with expert analysis of material properties, composition and chemistry to improve supply chain and manufacturing.
Specialized Pharmaceutical Services
Specialized pharmaceutical services beyond a CRO support the convergence of new technology and pharmaceutical innovation.
Stainless Steel Corrosion: Medical Device Applications with Auger
Auger Electron Spectroscopy (AES) is effective in determining the quality of passivation layers to prevent corrosion in medical devices.
Standards for SIMS
EAG Laboratories can offer a range of standards for SIMS used to calibrate materials such as Si, SiO2, SiN, Wsi, TiN, TiW, Al, GaAs, InP.
Statistical Analysis of Multilayer Structures in Electron Microscopy Using Image Processing
In this application note, we demonstrate our capability to generate a large number of measurements in a single image to determine the roughness of interfaces in a multilayer stack and the roughness correlation across layers.
Statistical Analysis of Three-Dimensional Particles Using FIB-SEM Tomography and Image Processing
FIB-SEM tomography and image processing enable us to extract statistical analysis of particles from three-dimensional and high-resolution imaging data.
Structural and Chemical Characterization of Li-ion Batteries
Structural and Chemical Characterization of Li-ion Batteries help to understand why batteries fail leading to safer products and improvements.
Surface Analysis of α-Si, µc-Si Thin Film PV
Surface analysis lab techniques on α-Si thin film PV, microcrystalline Si, nanocrystalline Si, amorphous SiGe, & microcrystalline SiC
Surface and Interface Characterization of Polymers
Analytical tools to understand chemical properties of polymers for adhesion, printability, barrier performance, appearance and strength
Surface Area and Pore Size Distribution via Gas Absorption Analysis
Surface area and pore structure are important considerations in many fields, impacting diverse industry concerns.
Surface Characterization of Antibacterial Coated Sutures
Antibacterial coated sutures reduce the occurrence of surgical site infections. Triclosan has been used in coatings on poliglecaprone.
Technology Law
Technology law covers the use of technology and covers all of the ways that devices and methods of communication impact society.
Testing Face Masks for Volatile Organic Compounds (VOCs)
Analytical methodology to evaluate a variety of different face masks for a class of chemicals known as volatile organic compounds
Testing for technology innovators
Through multidisciplinary science and engineering, EAG helps companies translate ideas into technology by supporting R&D, NPI and production.
Testing ionic and covalent bonds
EAG Laboratories can test for ionic or covalent bonds at our Sunnyvale, St. Louis, Minneapolis and Eindhoven facilities
Testing Products for Home & Garden
EAG offers analytical home and garden product lifecycle support, GLP registration and contaminant studies to label expansions and packaging.
The Art and Science of Paint Deformulation
Paint deformulation separates out components to be identified with the normal analytical techniques available to the chemist.
The Total Solution For Surface Contamination Measurements
TXRF AND SURFACESIMS.XP is the total solution for surface contamination measurements on semiconductor surfaces, from EAG Laboratories.
Thermal Analysis Techniques
Thermal Analysis Techniques at EAG include TGA, DSC, TMA and DMA help with materials identifications, failure analysis and deformulation.
Thermal Imaging Solutions for Microelectronics and Optoelectronics
Eurofins EAG Laboratories has recently enhanced its thermal imaging capabilities with the integration of Microsanj equipment.
Thermal Mapping at EAG
Temperature measurements of RF transistors to examine temperature distribution and look for areas of heating issues on many types of devices.
Thermogravimetric Analysis (TGA–FTIR)
Synthetic polymers are widely used in many industry sectors. TGA-FTIR is used for materials characterization and outgassing profiling.
Time Domain Reflectometry (TDR)
Time Domain Reflectometry (TDR) services from EAG – Each layer in the package may be inspected optically and probed electrically.
Trace Analysis of Titanium
EAG has more than 20 years of experience in purity certification and trace elemental analysis of titanium and alloys following ASTM Test Methods.
Two-dimensional Mapping of Matrix Elements in a Microelectronic Device by STEM-EELS
Two-dimensional mapping of matrix elements in electronic devices is discussed, as provided by STEM and EELS techniques from EAG Laboratories.
Types of crystal defects that can be observed with TEM
Transmission Electron Microscopy is often used to evaluate defects in crystals, but not all defects can be observed with TEM
Ultra High Performance Liquid Chromatography (UHPLC)
EAG uses ultra-high-performance liquid chromatography (UHPLC) to separate, identify & analyze different constituents of a chemical compound
Ultra-Trace Level Contaminants in materials using ETV–ICP–OES
Electrothermal vaporization (ETV) coupled with ICP-OES is an exceptionally sensitive solid sampling technique for purity verifications.
Understanding VCSELs: From Epitaxial Wafer Growth to Failure Analysis
EAG Laboratories to provide comprehensive process development and failure analysis of vertical cavity surface emitting lasers.
Using One Method for Screening Multiple Analytes of the Same Chemical Family: HPLC and Organic Acids
Screen fruit juices for organic acids using high performance liquid chromatography with diode array detection.
Using SIMS to Scrutinize HEMTs
HEMTs characterization using SIMS helps to uncover troublesome impurities, optimize epitaxial layer growth and aid failure analysis
Using STEM EELS to Probe Local Bonding Environment in VCSEL Oxide Apertures
Improper aperture oxidation can lead to high stress or introduce unintended defects ultimately resulting in failure. Here, we present a study using STEM EELS to provide a method for measuring differences in oxygen bonding.
UV-C Irradiation For Product Reliability Testing
UV-C Irradiation For Product Reliability Testing Ultraviolet light (UV-C) is used for the disinfection of surfaces, air and water. It is able to destroy the
VOC Analysis per EPA Method 24
VOC testing of paints and coatings per EPA Method 24. EAG ensures your company meets standards for volatile organic compound testing.
What is the difference between magnetic field type SIMS and quadrupole type SIMS?
Comparing and summarizing the features of magnetic field type SIMS instruments and quadrupole type SIMS instruments
What is the difference between SIMS and TOF-SIMS?
What is the difference between SIMS and TOF-SIMS? SIMS (Secondary Ion Mass Spectrometry) and TOF-SIMS (Time of Flight-SIMS) are the same in terms of mass
What is the matrix effect?
Compound semiconductor films are grown with different matrix compositions that affect the elemental sensitivities and sputtering rates
What is the relationship between Auger analysis and EDS analysis?
Both Auger Electron Spectroscopy (AES) and Energy Dispersive X-ray Spectroscopy (EDX / EDS) are used for elemental analysis.
What’s in your Kombucha extract?
We employed a combination of GCMS, XRF and Fourier transform infrared (FTIR) spectroscopy to determine the composition of a Kombucha extract.
Which method of sectioning is best for my sample?
Cross sectioning of a semiconductor die is a basic step in failure analysis work. A cross section can be used as a check of layer integrity.
Why Do Toothbrush Bristles Harden Over Time?
We investigate why Toothbrush bristles may begin to feel hard, stiff and rigid when compared to an unused toothbrush.
Will the Newest Wearable Device Leave You Itching for More?
Consumer wearables are evaluated for sensitizers by extractable & leachable studies. We describe how to evaluate potential safety issues.
X-ray Diffraction (XRD) Services
X-ray Diffraction XRD Services from EAG Laboratories is a powerful nondestructive technique for characterizing crystalline materials.
X-Ray Images at EAG
X-ray images from EAG include PCB layers, PC Board views, QFN, PCB Vias, QFP, Flip Chip, 9V Battery, BGA and BGA tilt and rotate.
XPS Analysis of Disposable Gloves
XPS Analysis of Disposable Gloves assesses materials exposed during product manufacturing to make sure contamination is not introduced.
XPS Analysis of Surface Modified Polymers
Polymer materials are in medical devices, automobiles, electronics, food packaging and in a wide range of industrial and consumer products.
XPS Analysis with C60 Sputtering
XPS Analysis for sputter etching polymers and other organic materials to provide chemical characterization and depth profiling
XPS chemical shift and valence
XPS (X-ray photoelectron spectroscopy) is capable of qualitative and quantitative analysis, and it can also determine chemical states.
XPS provides chemical bond information
XPS shows the species present can be determined or estimated from the measured chemical shift of the binding energy of each element