These tests, ranging from simple IV or CV tests to more complex evaluations, including DC parameters, structural assessments, and functional tests, aim to ensure the device is free of manufacturing defects. With semiconductor devices now containing billions of transistors, comprehensive functionality testing becomes increasingly challenging, prompting a rise in the adoption of system-level tests for complex devices. ATE systems are frequently utilized in failure analysis, capable of identifying failing tests and using shmoo plots to pinpoint failures within specific operating ranges of voltage, frequency, and timing. The Automated Test Equipment includes tools for recording test times, facilitating analysis to identify areas where the test time is longer than expected. As production data is collected and analyzed, sometimes a particular test can be eliminated, or allow investigation of specific tests to focus on optimization.

An engineer begins testing by creating a detailed plan that outlines the procedure for each specific test. They then program the ATE operating system to generate the corresponding test program. Modern practices often use table formats to specify the test flow and parameters like timing, voltage, current, and test patterns. Electronic Design Automation (EDA) tools from companies like Cadence, Synopsys, and Siemens help generate test patterns. The complexity of test program generation requires programming skills in languages like C++, Visual Basic, Java, and C# to create custom test methods not in the standard ATE system library. Python is also commonly used for processing data collected during the ATE test.