Material Reliability & Characterization in Europe Webinar
In this webinar we introduce Accelerated Life Testing and Failure Analysis techniques at EAG Laboratories Eindhoven
Polymer Case Study: Cracking of Molded Components
Used for everything from electronics to basic personal care items, injection molded plastic components are an essential part of most of today’s consumer products. These parts help create durable, cost-effective goods to meet consumer demand.
Case Study
An injection molded component in a consumer product was found to have an increased failure rate over a three-month period. The part contained a polyolefin copolymer and an inorganic filler.
Analysis
Comparisons were made between failed and control parts. Based on NMR spectroscopy, it was found that the failed sample had a different relative ratio of monomers compared to the control sample.
In addition, based on EDS elemental analysis of ash from loss on ignition testing, the inorganic filler material was found to contain different elements.
Result
These compositional differences were traced back to out-of-specification resins and issues with the raw material supply chain.
Failure Analysis of Polymers
For more than 50 years, scientists and engineers at Eurofins EAG have investigated and resolved product failures for clients. Our team of experts identify key failure indicators and follow them to the root cause.
Polymeric Materials Evaluated at EAG
Failure analysis of plastics, thermosets, and rubber materials is commonly performed on finished products and typically involve comparative analysis between failed and non-failed samples. Once the potential root cause is identified, experiments can be designed and conducted to test the hypothesis and recreate the failure in the laboratory. Eurofins EAG can evaluate a variety of polymer types, including:
- Raw materials in polymer formulations
- Adhesives (heat/moisture/UV-cured, silicones, epoxies, acrylates)
- Coatings (functional or decorative)
- Thermoplastics, thermosets, thermoplastic elastomers, composites
- Molded, extruded, cast components
Eurofins EAG Laboratories offers a full suite of analytical techniques to evaluate the identity, composition, morphology, topography, and rheology of polymeric materials and components.
- Chromatography: GC, GC-MS, HPLC, IC, LC-MS, Pyrolysis GC-MS, HS/TD/SPME GC-MS
- Inorganic Identification and Quantification: ICP-MS, ICP-OES, SEM-EDS, XRD, XRF
- Physical Testing: Contact Angle, Mechanical Testing, Rheometry, Viscometry
- Spectroscopy: Ellipsometry, FTIR, NIR, NMR, Raman, UV-Vis
- Surface Analysis: Auger, SEM, TOF-SIMS, XPS
- Surface Metrology: AFM, Nanoindentation, Profilometry
- Thermal Analysis: DMA, DSC, RGA, TGA, TGA-IR, TGA-MS, TMA
Contact Our Team
Call +1 800-366-3867 or email us.
Related Resources
- Webinar: Analytical Investigations of Plastics and Polymers
- Webinar: Characterization of Plasma Altered Polymer Surfaces
- Application Note: XPS Analysis of Surface Modified Polymers
- Blog: Polymer Case Study: Curing Issues with Silicone Adhesive
- Blog: Polymer Case Study: Delamination of Food Packaging
- Blog: Polymer Case Study: Environmental Stress Cracking of a Polycarbonate Part
- Blog: Polymer Case Study: Incompatible Contaminant
- Blog: Polymer Case Study: Molded In Stresses
- Blog: Polymer Case Study: Off-Odor Memory Foam
- Blog: Polymer Case Study: Weathering Polymeric Films
- Blog: Polymer Case Study: Blistering Paint
- Service: Polymer Chemistry
- Technique: Smart Chart
- Industry: Chemical Testing
- Industry: Consumer Electronics Testing
- Industry: Medical Devices
- Brochure: Failure Analysis of Polymers
More content you might like...
ESD Webinar
In this webinar we introduce electrostatic discharge (ESD) testing which is one of the failure mechanisms for integrated circuit parts
Navigating Consumer Electronics Development: Finished Products
As a trusted partner in the consumer electronics industry, we are ready to meet the evolving industry needs, advancing innovation and excellence.
Dual Beam FIB-SEM: Sample prepping and Imaging
The Dual Beam FIB-SEM integrates a focused ion beam with a scanning electron microscope for simultaneous sample prepping and imaging.