High reliability electronic components like integrated circuits are often required to operate for long periods of time, having little or no opportunity for replacement.
The long-term reliability of these components is especially important to the defense, aerospace, and automotive industries.
Destructive Physical Analysis (DPA) is a systematic detailed examination of components during various stages of physical disassembly. Parts are examined for a wide variety of design, workmanship, and processing problems that may not show up during normal screening tests.
DPA test is routinely used by the aerospace industry to qualify electronic components. More and more commercial applications are using DPA screening to dramatically increase the reliability of their products in the field.
Eurofins EAG Laboratories (formerly SEAL Laboratories) has been performing Destructive Physical Analysis (DPA) since 1972 on materials used in aerospace, commercial, military, and government applications.
With more than a half century of experience performing Destructive Physical Analysis, we can test your product for all standards.
• Integrated circuits
• Transistors
• Diodes
• Capacitors
• Resistors
• Relays
• Fuses
• Temperature sensors
• Filters, crystals
• Transformers, inductors, coils
• RF devices, microwave components
• Connectors, switches
• Hybrids containing multi-components
Our facilities are complete and DLA certified for Residual Gas Analysis/Internal Water Vapor (RGA), Particle Impact Noise Detection (PIND) X-Ray Radiography and SEM Inspection. Additional testing capabilities include External Visual Inspection, Hermetic Seal Testing (Fine Leak, Gross Leak), Delid/Decap/Case Removal, Internal Visual Inspection, Bond Pull Strength, Die Shear, SEM Inspection and Microsectioningelec.
Eurofins EAG Laboratories (EAG) is a leader in corrosion testing employing a multidisciplinary approach and advanced techniques to aid manufacturers in improving their products’ reliability.
June 27, 2024
During this live Ask the Expert event, we will answer pre-submitted questions from our audience regarding Elemental Analysis with Inductively Coupled Plasma (ICP-OES, ICP-MS, LA-ICP-MS). These techniques provide full survey major, minor, trace element analysis, and purity certification for up to 69 measurable elements.
In this webinar we introduce Leachables stability studies and will cover impurities, method and stability requirements.
As the list of restricted substances grows, testing demands customized methods to identify issues early. This is a complex issue that requires a strategic approach.
To enable certain features and improve your experience with us, this site stores cookies on your computer. Please click Continue to provide your authorization and permanently remove this message.
To find out more, please see our privacy policy.