Standards for SIMS

EAG Laboratories can offer a range of standards for SIMS used to calibrate materials such as Si, SiO2, SiN, Wsi, TiN, TiW, Al, GaAs, InP with various elemental ions implanted into the substrate.

Species Nominal Energy (keV) Nominal Dose (at/cm2)
1H 30 2×1015
7 Li 50 1×1014
11B 80 1×1014
12C 100 1×1015
14N 80 1×1015
18O 100 1×1014
19F 100 5X1014
23 Na 150 1×1014
24Mg 150 1×1014
27 Al 150 1×1014
31P 150 1×1014
34 S 150 1×1014
35 Cl 200 2×1014
39 K 200 1×10
40Ar 200 5×1015
40Ca 200 1×1014
48 Ti 150 5×1014
52Cr 200 2×1014
54Fe 200 1×1014
55Mn 200 1×1014
59 Co 200 1×1014
60 Ni 200 2×1014
65 Cu 200 1×1014
64 zn 200 1×1014
69 Ga 250 1×1014
70Ge 160 5×1014
75 As 80 1×1014
79 Br 250 1×1014
98 Mo 200 1×1014
106Pd 200 2×1014
107 Ag 200 2×1014
115In 300 1×1014
120Sn 300 1×1014
121Sb 200 6×1014
181 Ta 300 2×1014
184W 200 1×1014
195Pt 400 1×1014
197Au 200 1×1014
Si ion implant reference materials are 1.6 cm x 1.6 cm or 1.8 cm x 1.8 cm

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