Nanoprobing is a highly specialized analytical technique used in semiconductor physics and electronics industries. This technique utilizes nanometer-scale precision movement probes to make direct contact with individual semiconductor devices such as transistors. Being able to measure the electrical properties at this level facilitates accurate and non-destructive analysis of nanoscale features which are too small to perform using traditional, manual methods. It is vital to the scientific research and development of advanced electronic devices and materials, enabling the process of failure analysis, design validation, quality control, and manufacturing to help innovate smaller and more novel technologies. Nanoprobing is a key method for analyzing and testing electronic materials, and it can be applied to a broad range of samples such as:

• Integrated Circuits
• Transistors, Memory Bit Cells, Test Structures
• eFuses
• Nanotubes
• LEDs, Diodes, MEMS
• Solid State Batteries