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Services
Materials Testing
Advanced Microscopy
Battery Materials Analysis
Biomedical Analysis
Chemical Analysis
Chemical Compatibility
Composition & Materials ID
Contaminant Identification
Corrosion Testing
Custom Synthesis
Deformulation
Materials Testing
Extractables & Leachables
Failure Analysis - Materials
Glass Analysis
In Vitro Biocompatibility
Materials Characterization
Metallurgical Analysis
Polymer Chemistry
Specialized Sample Prep
Surface Analysis
Trace Elemental Analysis
Microelectronics & Engineering
ATE Test & Engineering
Burn-in & Reliability
DPA
ESD & Latch-up Testing
Failure Analysis
FIB Circuit Edit & Debug
PCB Design & Assembly
Warpage Analysis
Litigation Support
Consumer Product Safety
Expert Witness Testimony
Industrial Consulting
Intellectual Property
Product Liability
Techniques
SMART Chart
AFM
Air-Jet Sieve
Atom Probe
Auger
BET & DFT
CIC
Colorimetry
Contact Angle
Corrosion Testing
Cryo-FIB/SEM
Cryo-TEM
Density
DHEM
Dilatometry
DMA
DPA
DSC
Dual Beam - FIB
EBIC
EBSD
EDS
EELS
EGA
Electrochemical
Ellipsometry
Emissivity
ETV-ICP-OES
FTIR
GC
GC-MS
GC-MS/MS
GC/Q-TOF
GDMS
GFAAS
GPC
HALT & MEOST
HFS
HPLC
HRMS
IC
ICP-MS
ICP-OES
IGA
Impact
In Vitro
LA-ICP-MS
Laser Diffraction
LC-MS
Nanoindentation
NanoIR
NMR
NRA
OP
PED
PIXE
Plasma FIB
Reliability
Pyro-GC-MS
Raman
RBS
Refractrometry
RGA
Rheology
RTX
Salt Mist
SAM
SEM
SEM-CL
SIMS
TEM-STEM
Tensile
Tensiometry
TG-DTA
TG-EGA
TGA
Titrimetry
TLC
TMA
TOF-SIMS
TXRF
UV/VIS/NIR
Viscosity
XPS-ESCA
XRD
XRF
XRR
Industries
Aerospace
Automotive
Chemicals
Consumer Electronics
Defense
Energy
Law & Litigation
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